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LANDMARK MEASUREMENT SOLUTIONS

FLATNESS MEASUREMENT TOOL VIDEOS

NON-CONTACT OPTICAL METROLOGY INSTRUMENTS

SEMICONDUCTOR MEASUREMENT TOOLS

NON-CONTACT OPTICAL METROLOGY INSTRUMENTS
Corning Tropel Products

Measure Flatness, Thickness, NTV, TTV, Bow, Warp, Roughness, Edge profile with our instruments

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ULTRASORT II

Automated Wafer Flatness and Thickness Measurement

ULTRAFLAT

Robotic Mask Measurement System

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ULTRASORT I

Original Automated Wafer Measurement System

Learn More
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SEMI AUTOMATED WAFER

Manual Wafer Measurement System

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ilis gmbh

Real-time imaging polarimeters for industrial use in quality control and process monitoring

 

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CONTACT US

Interested in placing an order or learning more?
Simply reach out today.

9990 Coconut Rd.
Estero, FL 34135

Fabric Machinery in Factory
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